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Radial Pressure Instrumented Die - STYL'One Nano
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The axial stress impulsed by punches during powder compression induces a horizontal response called die wall pressure which is material dependent. The residual die wall pressure measured when the axial pressure is released must be controlled to prevent tablet defects such as capping, lamination or chipping. New or existing STYL'One Nano Compaction Simulators can be featured with an instrumented die to measure die wall pressure and avoid excessive stress against the die during ejection.
Available on models(s)
STYL'One Nano ;
STYL'One Nano WipCon ;
Key technical features
- Strain gages
- Dedicated 11.28-mm round flat tooling
- Up to 300 MPa
Key user benefits
- Understand the deformation behavior of your APIs and Excipients
- Improve tablet integrity by minimizing elastic recovery and die friction at ejection to prevent tablet defects like capping or lamination
- Secure efficient manufacturing of tablets right at the development stage
- Extend tool life and reduce wear and tear on punches & die by lowering die friction
Compatible with model(s)
STYL'One Nano
STYL'One Nano WipCon
STYL'One Nano
STYL'One Nano WipCon
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